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Dr. Steve Pennock, BSc, PhD, MIEEE

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Senior Lecturer

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Dr. Steve Pennock

Dr. Steve Pennock is a Senior Lecturer in the Department of Electronic & Electrical Engineering. He has been the co-author on over 85 journal and conference papers, is the co-author of a book "Microwave Engineering with Wireless Applications" with Peter Shepherd, and co-editor of "Microwave devices, circuirs & subsystems" with Ian Glover and Peter Shepherd.

Past research has covered the investigation of plasmas in dielectric waveguides and novel coupled line and diode structures in GaAs MMICís. Other work has included the development and analysis of antennas, couplers and diode mounts in the novel transmission media Inset Dielectric Guide (IDG). This work has recently extended analytic and numerical analysis techniques for examining co-planar and microstrip structures within IDG as circuit and antenna (patch in slot) media, and ferrite devices.

Current research interests include signal propagation at microwave and millimetre wave frequencies within buildings and near human bodies, along with the assessment of diversity techniques. Broadband flared slot antennas that have up to 4:1 or 80% bandwidth and are dual polarisation capable are a further focus of his research. A concept prototype of a Ground Penetrating Radar has recently been completed by a 4 strong team at Bath, involving the development and demonstration of the entire UHF and signal processing system. U.K. and U.S.A. patents have been awarded on aspects of this work. A further project, Mapping the Underworld, is looking at novel deployment configurations for Ground Penetrating Radar and fusion with acoustic and electrostatic detection techniques.

Recent industrial contracts have included the development of a mobile satellite tracking and SAR data processing station, and involvement in parts of a project developing a SAR system for detecting surface scattered anti-tank mines.

A recent project on Microwave (Photo) Electrochemistry developed the use of a non-contacting microwave measurement technique for observing photo and electrochemical processes on semiconductor surfaces.

Research Areas: